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Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
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Authors
Bastos, Joao
;
O'Sullivan, Barry
;
Franco, Jacopo
;
Tyaginov, Stanislav
;
Truijen, Brecht
;
Vaisman Chasin, Adrian
;
Degraeve, Robin
;
Kaczer, Ben
;
Ritzenthaler, Romain
;
Capogreco, Elena
;
Dentoni Litta, Eugenio
;
Spessot, Alessio
;
Higashi, Yusuke
;
Yoon, Younggwang
;
Machkaoutsan, Vladimir
;
Fazan, Pierre
;
Horiguchi, Naoto
DOI
10.1109/IRPS48227.2022.9764547
EISBN
978-1-6654-7950-9
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
Publication type
Proceedings paper
Embargo date
9999-12-31
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2
20.500.12860/41151.2
*
2023-04-26T08:17:32Z
validation by library/open access desk
1
20.500.12860/41151
2023-02-27T03:27:53Z
*Selected version
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