Publication:

Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764547

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Published version 982.02 KB

Author(s)

;

O'Sullivan, Barry

;

;

Tyaginov, Stanislav

;

Truijen, Brecht

;

Vaisman Chasin, Adrian

;

Degraeve, Robin

;

;

Ritzenthaler, Romain

;

Capogreco, Elena

;

Dentoni Litta, Eugenio

;

Spessot, Alessio

;

Higashi, Yusuke

;

Yoon, Younggwang

;

Machkaoutsan, Vladimir

;

;

Horiguchi, Naoto

Journal

na

Metrics

1380 since deposited on 2023-02-27

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Acq. date: 2026-01-09