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Physics-based device aging modelling framework for accurate circuit reliability assessment
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Authors
Wu, Zhicheng
;
Franco, Jacopo
;
Truijen, Brecht
;
Roussel, Philippe
;
Tyaginov, Stanislav
;
Vandemaele, Michiel
;
Bury, Erik
;
Groeseneken, Guido
;
Linten, Dimitri
;
Kaczer, Ben
DOI
10.1109/IRPS46558.2021.9405106
EISBN
978-1-7281-6893-7
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
Physics-based device aging modelling framework for accurate circuit reliability assessment
Publication type
Proceedings paper
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