Publication:

Physics-based device aging modelling framework for accurate circuit reliability assessment

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405106

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Author(s)

;

;

Truijen, Brecht

;

Roussel, Philippe

;

Tyaginov, Stanislav

;

Vandemaele, Michiel

;

;

Groeseneken, Guido

;

Linten, Dimitri

;

Journal

na

Metrics

1887 since deposited on 2022-03-11

2last month

Acq. date: 2025-12-15