Publication:
Compact model of the entire I-V characteristic for accurate description of the asymmetric degradation of pMOSFETs during off-state stress
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1873 since deposited on 2021-10-27
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Acq. date: 2026-08-06
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Statistics
Views
1873 since deposited on 2021-10-27
2last month
2last week
Acq. date: 2026-08-06
Citations