Publication:
Compact model of the entire I-V characteristic for accurate description of the asymmetric degradation of pMOSFETs during off-state stress
Date
| dc.contributor.author | Truijen, Brecht | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.imecauthor | Truijen, Brecht | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.date.accessioned | 2021-10-27T19:53:31Z | |
| dc.date.available | 2021-10-27T19:53:31Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34143 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8989890 | |
| dc.source.conference | 2019 IEEE International Integrated Reliability Workshop (IIRW) | |
| dc.source.conferencedate | 13/10/2019 | |
| dc.source.conferencelocation | South Lake Tahoe, CA USA | |
| dc.title | Compact model of the entire I-V characteristic for accurate description of the asymmetric degradation of pMOSFETs during off-state stress | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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