dc.contributor.author | Truijen, Brecht | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Alam, Md Nur Kutubul | |
dc.contributor.author | Claes, Dieter | |
dc.contributor.author | Thesberg, M. | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2023-06-02T07:44:45Z | |
dc.date.available | 2023-02-27T03:28:20Z | |
dc.date.available | 2023-06-02T07:44:45Z | |
dc.date.issued | 2022 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000922926400168 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41176.2 | |
dc.source | WOS | |
dc.title | Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Truijen, Brecht | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Alam, Md Nur Kutubul | |
dc.contributor.imecauthor | Claes, Dieter | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Alam, Md Nur Kutubul::0000-0002-4608-3556 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/IRPS48227.2022.9764603 | |
dc.identifier.eisbn | 978-1-6654-7950-9 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 27-31, 2022 | |
dc.source.conferencelocation | Dallas | |
dc.source.journal | na | |
imec.availability | Published - imec | |