Publication:

Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks

Date

2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764603
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 1.19 MB

Author(s)

Truijen, Brecht  
;
O'Sullivan, Barry  
;
Alam, Md Nur Kutubul  
;
Claes, Dieter  
;
Thesberg, M.
;
Roussel, Philippe  
;
Vaisman Chasin, Adrian  
;
Van den Bosch, Geert  
;
Kaczer, Ben  
;
Van Houdt, Jan  

Journal

na

Abstract

Description

Statistics

Views

1239 since deposited on 2023-02-27
1last month
Acq. date: 2026-02-24

Citations

Statistics

Views

1239 since deposited on 2023-02-27
1last month
Acq. date: 2026-02-24

Citations