Publication:

Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks

Date

2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764603
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Published version 1.19 MB

Author(s)

Truijen, Brecht  
;
O'Sullivan, Barry  
;
Alam, Md Nur Kutubul  
;
Claes, Dieter  
;
Thesberg, M.
;
Roussel, Philippe  
;
Vaisman Chasin, Adrian  
;
Van den Bosch, Geert  
;
Kaczer, Ben  
;
Van Houdt, Jan  

Journal

na

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1235 since deposited on 2023-02-27
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Acq. date: 2025-10-24

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