Publication:

Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764603

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Files

Published version 1.19 MB

Author(s)

Truijen, Brecht

;

O'Sullivan, Barry

;

Alam, Md Nur Kutubul

;

;

;

Roussel, Philippe

;

Vaisman Chasin, Adrian

;

Van den Bosch, Geert

;

;

Journal

na

Metrics

1238 since deposited on 2023-02-27

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Acq. date: 2026-01-07