Authors

Wu, Zhicheng; Franco, Jacopo; Claes, Dieter; Rzepa, Gerhard; Roussel, Philippe; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben

Conference

2019 IRPS IEEE International Reliability Physics Symposium - IRPS

Title

Accelerated Capture and Emission (ACE) measurement pattern for efficient BTI characterization and modeling

Publication type

Proceedings paper