Browsing by author "Schleich, Christian"
Now showing items 1-5 of 5
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Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Waldhoer, Dominic; Schleich, Christian; Michl, Jakob; Grill, Alexander; Claes, Dieter; Karl, Alexander; Knobloch, Theresia; Rzepa, Gerhard; Franco, Jacopo; Kaczer, Ben; Waltl, Michael; Grasser, Tibor (2023) -
Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
Vasilev, Alexander; Jech, Markus; Grill, Alexander; Rzepa, Gerhard; Schleich, Christian; Makarov, Alexander; Pobegen, Gregor; Grasser, Tibor; Waltl, Michael; Tyaginov, Stanislav (2020) -
Physical modeling of bias temperature instabilities in SiC MOSFETs
Schleich, Christian; Berens, Judith; Rzepa, Gerhard; Pobegen, Gregor; Rescher, Gerald; Tyaginov, Stanislav; Grasser, Tibor; Waltl, Michael (2019) -
Single-Versus Multi-Step Trap Assisted Tunneling Currents-Part II: The Role of Polarons
Schleich, Christian; Waldhoer, Dominic; El-Sayed, Al-Moatasem; Tselios, Konstantinos; Kaczer, Ben; Grasser, Tibor; Waltl, Michael (2022) -
TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
Vasilev, Alexander; Jech, Markus; Grill, Alexander; Rzepa, Gerhard; Schleich, Christian; Tyaginov, Stanislav; Makarov, Alexander; Pobegen, Gregor; Grasser, Tibor; Waltl, Michael (2022-04-19)