Physical modeling of bias temperature instabilities in SiC MOSFETs

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Authors
Schleich, Christian; Berens, Judith; Rzepa, Gerhard; Pobegen, Gregor; Rescher, Gerald; Tyaginov, Stanislav; Grasser, Tibor; Waltl, Michael
Conference
IEEE International Electron Device Meeting -- IEDM
Title
Physical modeling of bias temperature instabilities in SiC MOSFETs
Publication type
Proceedings paper
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