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Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
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Authors
Vasilev, Alexander
;
Jech, Markus
;
Grill, Alexander
;
Rzepa, Gerhard
;
Schleich, Christian
;
Makarov, Alexander
;
Pobegen, Gregor
;
Grasser, Tibor
;
Waltl, Michael
;
Tyaginov, Stanislav
DOI
10.1109/IIRW49815.2020.9312864
EISBN
978-1-7281-7058-9
ISSN
1930-8841
Conference
IEEE International Integrated Reliability Workshop (IIRW)
Journal
na
Title
Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
Publication type
Proceedings paper
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2
20.500.12860/37872.2
*
2022-01-19T10:50:16Z
validation by library/open access desk
1
20.500.12860/37872
2021-11-02T16:01:03Z
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