Publication:

Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors

Date

2020

Proceedings Paper

https://doi.org/10.1109/IIRW49815.2020.9312864

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Author(s)

Vasilev, Alexander

;

;

Grill, Alexander

;

;

Schleich, Christian

;

Makarov, Alexander

;

Pobegen, Gregor

;

;

;

Tyaginov, Stanislav

Journal

na

Metrics

1875 since deposited on 2021-11-02

Acq. date: 2025-12-10