dc.contributor.author | Vasilev, Alexander | |
dc.contributor.author | Jech, Markus | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Rzepa, Gerhard | |
dc.contributor.author | Schleich, Christian | |
dc.contributor.author | Makarov, Alexander | |
dc.contributor.author | Pobegen, Gregor | |
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Waltl, Michael | |
dc.contributor.author | Tyaginov, Stanislav | |
dc.date.accessioned | 2022-01-19T10:51:39Z | |
dc.date.available | 2021-11-02T16:01:03Z | |
dc.date.available | 2022-01-19T10:51:39Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1930-8841 | |
dc.identifier.other | WOS:000659349800006 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37872.2 | |
dc.source | WOS | |
dc.title | Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Tyaginov, Stanislav | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.identifier.doi | 10.1109/IIRW49815.2020.9312864 | |
dc.identifier.eisbn | 978-1-7281-7058-9 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 31 | |
dc.source.endpage | 34 | |
dc.source.conference | IEEE International Integrated Reliability Workshop (IIRW) | |
dc.source.conferencedate | OCT 04-NOV 01, 2020 | |
dc.source.conferencelocation | South Lake Tahoe, CA, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |