Browsing by author "Michl, Jakob"
Now showing items 1-4 of 4
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Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Waldhoer, Dominic; Schleich, Christian; Michl, Jakob; Grill, Alexander; Claes, Dieter; Karl, Alexander; Knobloch, Theresia; Rzepa, Gerhard; Franco, Jacopo; Kaczer, Ben; Waltl, Michael; Grasser, Tibor (2023) -
Efficient Modeling of Charge Trapping a Cryogenic Temperatures-Part II: Experimental
Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, Tibor; Waltl, Michael (2021) -
Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory
Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Waltl, Michael; Grasser, Tibor (2021) -
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout; Michl, Jakob; Grill, Alexander; Kaczer, Ben; Garcia Bardon, Marie; Parvais, Bertrand; Govoreanu, Bogdan; De Greve, Kristiaan; Hiblot, Gaspard; Hellings, Geert (2023)