Browsing by author "Grill, Alexander"
Now showing items 21-40 of 42
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Millikelvin temperature cryo-CMOS multiplexer for scalable quantum device characterisation
Potocnik, Anton; Brebels, Steven; Verjauw, Jeroen; Acharya, Rohith; Grill, Alexander; Wan, Danny; Mongillo, Massimo; Li, Ruoyu; Ivanov, Tsvetan; Van Winckel, Steven; Mohiyaddin, Fahd Ayyalil; Govoreanu, Bogdan; Craninckx, Jan; Radu, Iuliana (2022) -
Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities
Jech, Markus; Rott, Gunnar; Reisinger, Hans; Tyaginov, Stanislav; Rzepa, Gerhard; Grill, Alexander; Jabs, Dominic; Jungemann, Christoph; Waltl, Michael; Grasser, Tibor (2020) -
Modeling and Understanding the Compact Performance of h-BN Dual-Gated ReS2 Transistor
Lee, Kookjin; Choi, Junhee; Kaczer, Ben; Grill, Alexander; Lee, Jae Woo; Van Beek, Simon; Bury, Erik; Diaz Fortuny, Javier; Vaisman Chasin, Adrian; Lee, Jaewoo; Chun, Jungu; Shin, Dong Hoon; Na, Junhong; Cho, Hyeran; Lee, Sang Wook; Kim, Gyu-Tae (2021) -
Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors
Vasilev, Alexander; Jech, Markus; Grill, Alexander; Rzepa, Gerhard; Schleich, Christian; Makarov, Alexander; Pobegen, Gregor; Grasser, Tibor; Waltl, Michael; Tyaginov, Stanislav (2020) -
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
O'Sullivan, Barry; Truijen, Brecht; Putcha, Vamsi; Grill, Alexander; Vaisman Chasin, Adrian; Van den Bosch, Geert; Kaczer, Ben; Alam, Md Nur Kutubul; Van Houdt, Jan (2022) -
Multiplexed superconducting qubit control at millikelvin temperatures with a low-power cryo-CMOS multiplexer
Acharya, Rohith; Brebels, Steven; Grill, Alexander; Verjauw, Jeroen; Ivanov, Tsvetan; Perez Lozano, Daniel; Wan, Danny; Van Damme, Jacques; Ananthapadmanabha Rao, Vadiraj; Mongillo, Massimo; Govoreanu, Bogdan; Craninckx, Jan; Radu, Iuliana; De Greve, Kristiaan; Gielen, Georges; Catthoor, Francky; Potocnik, Anton (2023) -
Nanoscale evidence for the superior reliability of SiGe high-k pMOSFETs
Waltl, Michael; Grill, Alexander; Rzepa, Gerhard; Goes, Wolfgang; Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Grasser, Tibor (2016) -
New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications
Asanovski, R.; Grill, Alexander; Franco, Jacopo; Palestri, P.; Beckers, Arnout; Kaczer, Ben; Selmi, L. (2022) -
On the impact of mechanical stress on gate oxide trapping
Goes, W.; Grasser, T.; Kruv, Anastasiia; Kaczer, Ben; Grill, Alexander; Gonzalez, Mario; Franco, Jacopo; Linten, Dimitri; De Wolf, Ingrid (2020) -
Physical model of low-temperature to cryogenic threshold voltage in MOSFETs
Beckers, Arnout; Jaezeri, Farzan; Grill, Alexander; Narasimhamoorthy, Subramanian; Parvais, Bertrand; Enz, Christian (2020) -
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2020) -
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout; Michl, Jakob; Grill, Alexander; Kaczer, Ben; Garcia Bardon, Marie; Parvais, Bertrand; Govoreanu, Bogdan; De Greve, Kristiaan; Hiblot, Gaspard; Hellings, Geert (2023) -
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
Michl, J.; Grasser, T.; Waltl, M.; Grill, Alexander; Bury, Erik; Tyaginov, Stanislav; Linten, Dimitri; Parvais, Bertrand; Kaczer, Ben; Radu, Iuliana (2020) -
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress
Lee, Kookjin; Kaczer, Ben; Kruv, Anastasiia; Gonzalez, Mario; Eneman, Geert; Okudur, Oguzhan Orkut; Grill, Alexander; Franco, Jacopo; Vici, Andrea; Degraeve, Robin; De Wolf, Ingrid (2022) -
Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs
Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, Alexander; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications
Lorenzelli, Francesco; Elsayed, Asser; Godfrin, Clement; Grill, Alexander; Kubicek, Stefan; Li, Roy; Stucchi, Michele; Wan, Danny; De Greve, Kristiaan; Marinissen, Erik Jan; Gielen, Georges (2023) -
TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
Vasilev, Alexander; Jech, Markus; Grill, Alexander; Rzepa, Gerhard; Schleich, Christian; Tyaginov, Stanislav; Makarov, Alexander; Pobegen, Gregor; Grasser, Tibor; Waltl, Michael (2022-04-19) -
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
Grill, Alexander; John, Valentin; Michl, J.; Beckers, Arnout; Bury, Erik; Tyaginov, Stanislav; Parvais, Bertrand; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; Govoreanu, Bogdan (2022) -
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2021) -
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors
Tyaginov, Stanislav; Makarov, Alexander; El-Sayed, Al-Moatasem Bellah; Vaisman Chasin, Adrian; Bury, Erik; Jech, Markus; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Vexler, Mikhail; Eneman, Geert; Kaczer, Ben (2022)