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Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors
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Authors
Tyaginov, Stanislav
;
Makarov, Alexander
;
El-Sayed, Al-Moatasem Bellah
;
Vaisman Chasin, Adrian
;
Bury, Erik
;
Jech, Markus
;
Vandemaele, Michiel
;
Grill, Alexander
;
De Keersgieter, An
;
Vexler, Mikhail
;
Eneman, Geert
;
Kaczer, Ben
DOI
10.1109/IRPS48227.2022.9764515
EISBN
978-1-6654-7950-9
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors
Publication type
Proceedings paper
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Summary
2
20.500.12860/41189.2
*
2023-06-14T10:19:41Z
validation by library/open access desk
1
20.500.12860/41189
2023-02-27T03:28:48Z
*Selected version
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