Authors
Lorenzelli, Francesco;
Elsayed, Asser;
Godfrin, Clement;
Grill, Alexander;
Kubicek, Stefan;
Li, Roy;
Stucchi, Michele;
Wan, Danny;
De Greve, Kristiaan;
Marinissen, Erik Jan;
Gielen, Georges
EISBN
979-8-3503-3634-4
ISSN
1530-1877
Conference
28th IEEE European Test Symposium (ETS)
Journal
28th IEEE European Test Symposium (ETS)
Research discipline
Electrical & electronic engineering
Title
Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications
Publication type
Proceedings paper
Embargo date
9999-12-31