Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Lorenzelli, Francesco; Elsayed, Asser; Godfrin, Clement; Grill, Alexander; Kubicek, Stefan; Li, Roy; Stucchi, Michele; Wan, Danny; De Greve, Kristiaan; Marinissen, Erik Jan; Gielen, Georges

doi:10.1109/ets56758.2023.10173954

Publication:

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Date

2023

Proceedings Paper

https://doi.org/10.1109/ets56758.2023.10173954

Simple item page Full metadata Statistics

Files

Published version 6.39 MB

Author(s)

Lorenzelli, Francesco

;

;

;

;

;

;

;

;

;

;

Journal

28th IEEE European Test Symposium (ETS)

Statistics

816 since deposited on 2023-08-20

5last month

Acq. date: 2026-08-05

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Views

Citations

Statistics

Views

Citations