Publication:

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Date

2023
Proceedings Paper
https://doi.org/10.1109/ETS56758.2023.10173954
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dc.contributor.authorLorenzelli, Francesco
dc.contributor.authorElsayed, Asser
dc.contributor.authorGodfrin, Clement
dc.contributor.authorGrill, Alexander
dc.contributor.authorKubicek, Stefan
dc.contributor.authorLi, Roy
dc.contributor.authorStucchi, Michele
dc.contributor.authorWan, Danny
dc.contributor.authorDe Greve, Kristiaan
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorGielen, Georges
dc.contributor.imecauthorLorenzelli, Francesco
dc.contributor.imecauthorElsayed, Asser
dc.contributor.imecauthorGodfrin, Clement
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorLi, Roy
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorWan, Danny
dc.contributor.imecauthorDe Greve, Kristiaan
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecLorenzelli, Francesco::0000-0001-6465-7157
dc.contributor.orcidimecElsayed, Asser::0000-0002-5264-5682
dc.contributor.orcidimecGodfrin, Clement::0000-0002-5244-3474
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecWan, Danny::0000-0003-4847-3184
dc.contributor.orcidimecDe Greve, Kristiaan::0000-0002-1314-9715
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecLi, Roy::0000-0002-2145-7590
dc.contributor.orcidimecKubicek, Stefan::0009-0006-2163-5760
dc.contributor.orcidimecStucchi, Michele::0000-0002-7848-0492
dc.date.accessioned2024-05-06T14:57:41Z
dc.date.available2023-08-20T18:03:14Z
dc.date.available2023-08-28T07:53:03Z
dc.date.available2024-05-06T14:57:41Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.identifier.doi10.1109/ETS56758.2023.10173954
dc.identifier.eisbn979-8-3503-3634-4
dc.identifier.issn1530-1877
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42370
dc.publisherIEEE
dc.source.conference28th IEEE European Test Symposium (ETS)
dc.source.conferencedateMAY 22-26, 2023
dc.source.conferencelocationVenice
dc.source.journal28th IEEE European Test Symposium (ETS)
dc.source.numberofpages6
dc.subject.disciplineElectrical & electronic engineering
dc.subject.keywordsDEGRADATION
dc.subject.keywordstransistor, quantum, quantum dot, single electron transistor, testing, screening, room temperature
dc.title

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

dc.typeProceedings paper
dspace.entity.typePublication
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