Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Lorenzelli, Francesco; Elsayed, Asser; Godfrin, Clement; Grill, Alexander; Kubicek, Stefan; Li, Roy; Stucchi, Michele; Wan, Danny; De Greve, Kristiaan; Marinissen, Erik Jan; Gielen, Georges

doi:10.1109/ETS56758.2023.10173954

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Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

Date

2023

Proceedings Paper

https://doi.org/10.1109/ETS56758.2023.10173954

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Lorenzelli, Francesco

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28th IEEE European Test Symposium (ETS)

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810 since deposited on 2023-08-20

Acq. date: 2026-02-27

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications

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