dc.contributor.author | Lorenzelli, Francesco | |
dc.contributor.author | Elsayed, Asser | |
dc.contributor.author | Godfrin, Clement | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Kubicek, Stefan | |
dc.contributor.author | Li, Roy | |
dc.contributor.author | Stucchi, Michele | |
dc.contributor.author | Wan, Danny | |
dc.contributor.author | De Greve, Kristiaan | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Gielen, Georges | |
dc.date.accessioned | 2024-05-06T14:57:41Z | |
dc.date.available | 2023-08-20T18:03:14Z | |
dc.date.available | 2023-08-28T07:53:03Z | |
dc.date.available | 2024-05-06T14:57:41Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1530-1877 | |
dc.identifier.other | WOS:001032757100005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42370.3 | |
dc.source | WOS | |
dc.title | Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Lorenzelli, Francesco | |
dc.contributor.imecauthor | Elsayed, Asser | |
dc.contributor.imecauthor | Godfrin, Clement | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Kubicek, Stefan | |
dc.contributor.imecauthor | Li, Roy | |
dc.contributor.imecauthor | Stucchi, Michele | |
dc.contributor.imecauthor | Wan, Danny | |
dc.contributor.imecauthor | De Greve, Kristiaan | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Gielen, Georges | |
dc.contributor.orcidimec | Lorenzelli, Francesco::0000-0001-6465-7157 | |
dc.contributor.orcidimec | Elsayed, Asser::0000-0002-5264-5682 | |
dc.contributor.orcidimec | Godfrin, Clement::0000-0002-5244-3474 | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Wan, Danny::0000-0003-4847-3184 | |
dc.contributor.orcidimec | De Greve, Kristiaan::0000-0002-1314-9715 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.contributor.orcidimec | Li, Roy::0000-0002-2145-7590 | |
dc.contributor.orcidimec | Kubicek, Stefan::0009-0006-2163-5760 | |
dc.contributor.orcidimec | Stucchi, Michele::0000-0002-7848-0492 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/ETS56758.2023.10173954 | |
dc.identifier.eisbn | 979-8-3503-3634-4 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.subject.discipline | Electrical & electronic engineering | |
dc.source.conference | 28th IEEE European Test Symposium (ETS) | |
dc.source.conferencedate | MAY 22-26, 2023 | |
dc.source.conferencelocation | Venice | |
dc.source.journal | 28th IEEE European Test Symposium (ETS) | |
imec.availability | Published - imec | |