Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs

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Authors

Makarov, Alexander; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, Alexander; Vandemaele, Michiel; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav

ISSN

0741-3106

Issue

6

Journal

IEEE Electron Device Letters

Volume

40

Title

Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs

Publication type

Journal article

Embargo date

9999-12-31

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