Publication:

Stochastic modeling of the impact of random dopants on hot-carrier degradation in n-FinFETs

Date

2019
Journal article
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Author(s)

Makarov, Alexander
;
Kaczer, Ben  
;
Roussel, Philippe  
;
Vaisman Chasin, Adrian  
;
Grill, Alexander  
;
Vandemaele, Michiel  
;
Hellings, Geert  
;
El-Sayed, Al-Moatasem
;
Grasser, Tibor
;
Linten, Dimitri  
;
Tyaginov, Stanislav  

Journal

IEEE Electron Device Letters

Abstract

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