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The impact of self-heating and its implications on hot-carrier degradation-A modeling study
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Authors
Makarov, A.
;
Jech, M.
;
Tyaginov, Stanislav
;
Vaisman Chasin, Adrian
;
Bury, Erik
;
Vandemaele, Michiel
;
Grill, Alexander
;
De Keersgieter, An
;
Linten, Dimitri
;
Kaczer, Ben
DOI
10.1016/j.microrel.2021.114156
ISSN
0026-2714
Issue
1
Journal
MICROELECTRONICS RELIABILITY
Volume
122
Title
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Publication type
Journal article
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2
20.500.12860/37869.2
*
2021-11-23T09:11:34Z
validation by library/open access desk
1
20.500.12860/37869
2021-11-02T16:01:02Z
*Selected version
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