Browsing by author "Jech, M."
Now showing items 1-10 of 10
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Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking
Franco, Jacopo; de Marneffe, Jean-Francois; Vandooren, Anne; Kimura, Yosuke; Nyns, Laura; Wu, Zhicheng; El-Sayed, A-M; Jech, M.; Waldhoer, D.; Claes, Dieter; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Afanas'ev, V.; Stesmans, A.; Horiguchi, Naoto; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2020) -
COMPHY - A compact-physics framework for unified modeling of BTI
Rzepa, Gerhard; Franco, Jacopo; O'Sullivan, Barry; Subirats, Alexandre; Simicic, Marko; Hellings, Geert; Weckx, Pieter; Jech, M.; Knobloch, T.; Waltl, M.; Roussel, Philippe; Linten, Dimitri; Kaczer, Ben; Grasser, T. (2018) -
Efficient physical defect model applied to PBTI in high-k stacks
Rzepa, G.; Franco, Jacopo; Subirats, Alexandre; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Waltl, M.; Knobloch, T.; Stampfer, B.; Chiarella, Thomas; Horiguchi, Naoto; Ragnarsson, Lars-Ake; Linten, Dimitri; Grasser, T.; Kaczer, Ben (2017) -
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Makarov, A; Tyaginov, Stanislaw; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M.; Linten, Dimitri; Grasser, Tibor (2017) -
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Makarov, A.; Tyaginov, S. E.; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M. I.; Linten, Dimitri; Grasser, T. (2017) -
Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices
Kaczer, Ben; Franco, Jacopo; Tyaginov, S. E.; Jech, M.; Rzepa, G.; Grasser, T.; O'Sullivan, Barry; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Linten, Dimitri; Horiguchi, Naoto (2017) -
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2020) -
Physics-based modeling of hot-carrier degradation in Ge NWFETs
Tyaginov, Stanislav; Vaisman Chasin, Adrian; Makarov, A.; El-Sayed, A.; Jech, M.; De Keersgieter, An; Eneman, Geert; Vandemaele, Michiel; Franco, Jacopo; Linten, Dimitri; Kaczer, Ben (2019) -
Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, A.M.; Jech, M.; Grasser, T.; Linten, Dimitri; Tyaginov, Stanislav (2020) -
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2021)