Publication:

Physics-based modeling of hot-carrier degradation in Ge NWFETs

Date

2019
Proceedings Paper
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Author(s)

Tyaginov, Stanislav  
;
Vaisman Chasin, Adrian  
;
Makarov, A.
;
El-Sayed, A.
;
Jech, M.
;
De Keersgieter, An  
;
Eneman, Geert  
;
Vandemaele, Michiel  
;
Franco, Jacopo  
;
Linten, Dimitri  
;
Kaczer, Ben  

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1918 since deposited on 2021-10-27
1last month
Acq. date: 2026-01-12

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