Publication:

Physics-based modeling of hot-carrier degradation in Ge NWFETs

Date

2019

Proceedings Paper

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Files

45568.pdf 999.13 KB

Author(s)

Tyaginov, Stanislav

;

Vaisman Chasin, Adrian

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;

;

;

De Keersgieter, An

;

;

Vandemaele, Michiel

;

;

Linten, Dimitri

;

Statistics

1918 since deposited on 2021-10-27

Acq. date: 2026-02-25