Publication:

Physics-based modeling of hot-carrier degradation in Ge NWFETs

Date

2019
Proceedings Paper
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dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMakarov, A.
dc.contributor.authorEl-Sayed, A.
dc.contributor.authorJech, M.
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorEneman, Geert
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorFranco, Jacopo
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-27T20:05:49Z
dc.date.available2021-10-27T20:05:49Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34161
dc.source.beginpage565
dc.source.conferenceInternational Conference on Solid-State Devices and Materials - SSDM
dc.source.conferencedate2/09/2019
dc.source.conferencelocationNagoya Japan
dc.source.endpage566
dc.title

Physics-based modeling of hot-carrier degradation in Ge NWFETs

dc.typeProceedings paper
dspace.entity.typePublication
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