Physics-based modeling of hot-carrier degradation in Ge NWFETs

Simple item page Full metadata Statistics

Files

45568.pdf 999.13 KB

Author(s)

Tyaginov, Stanislav

;

Vaisman Chasin, Adrian

;

;

;

;

De Keersgieter, An

;

;

Vandemaele, Michiel

;

;

Linten, Dimitri

;

Metrics

1915 since deposited on 2021-10-27

Acq. date: 2025-10-23