Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

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37899.pdf 3.34 MB

Author(s)

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Tyaginov, S. E.

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O'Sullivan, Barry

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Ritzenthaler, Romain

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Spessot, Alessio

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Linten, Dimitri

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Horiguchi, Naoto

Journal

Journal of Vacuum Science and Technology B

Metrics

1967 since deposited on 2021-10-24

Acq. date: 2025-10-23