Publication:

Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

Date

2017

Journal article

Simple item page Full metadata Statistics

Files

37899.pdf 3.34 MB

Author(s)

;

;

Tyaginov, S. E.

;

;

;

;

O'Sullivan, Barry

;

Ritzenthaler, Romain

;

;

Spessot, Alessio

;

Linten, Dimitri

;

Horiguchi, Naoto

Journal

Journal of Vacuum Science and Technology B

Statistics

1977 since deposited on 2021-10-24

1last month

Acq. date: 2026-05-16