Publication:

Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

Date

2017
Journal article
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dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTyaginov, S. E.
dc.contributor.authorJech, M.
dc.contributor.authorRzepa, G.
dc.contributor.authorGrasser, T.
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorSchram, Tom
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-24T06:28:08Z
dc.date.available2021-10-24T06:28:08Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn1071-1023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28617
dc.identifier.urlhttp://avs.scitation.org/doi/full/10.1116/1.4972872
dc.source.beginpage01A109
dc.source.issue1
dc.source.journalJournal of Vacuum Science and Technology B
dc.source.volume35
dc.title

Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

dc.typeJournal article
dspace.entity.typePublication
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