Browsing by author "Makarov, A."
Now showing items 1-7 of 7
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A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs
Sharma, P.; Tyaginov, S.; Rauch, S.E.; Franco, Jacopo; Kaczer, Ben; Makarov, A.; Vexler, M.I.; Grasser, T. (2016) -
Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Makarov, A.; Tyaginov, S. E.; Kaczer, Ben; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Hellings, Geert; Vexler, M. I.; Linten, Dimitri; Grasser, T. (2017) -
Modeling the effect of random dopants on hot-carrier degradation in FinFETs
Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Grill, A.; Vandemaele, Michiel; Hellings, Geert; El-Sayed, E.-M.; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2020) -
Physics-based modeling of hot-carrier degradation in Ge NWFETs
Tyaginov, Stanislav; Vaisman Chasin, Adrian; Makarov, A.; El-Sayed, A.; Jech, M.; De Keersgieter, An; Eneman, Geert; Vandemaele, Michiel; Franco, Jacopo; Linten, Dimitri; Kaczer, Ben (2019) -
Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
Makarov, A.; Kaczer, Ben; Roussel, Philippe; Vaisman Chasin, Adrian; Vandemaele, Michiel; Hellings, Geert; El-Sayed, A.M.; Jech, M.; Grasser, T.; Linten, Dimitri; Tyaginov, Stanislav (2020) -
The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Makarov, A.; Jech, M.; Tyaginov, Stanislav; Vaisman Chasin, Adrian; Bury, Erik; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Linten, Dimitri; Kaczer, Ben (2021)