Authors

Sharma, P.; Tyaginov, S.; Rauch, S.E.; Franco, Jacopo; Kaczer, Ben; Makarov, A.; Vexler, M.I.; Grasser, T.

Conference

46th European Solid-State Device Research Conference - ESSDERC

Title

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs

Publication type

Proceedings paper

Embargo date

9999-12-31