Publication:
A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs
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1960 since deposited on 2021-10-23
2last month
Acq. date: 2025-12-11
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Metrics
Views
1960 since deposited on 2021-10-23
2last month
Acq. date: 2025-12-11
Citations