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Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
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Authors
Tyaginov, Stanislav
;
Bury, Erik
;
Grill, Alexander
;
Yu, Zhuoqing
;
Makarov, Alexander
;
De Keersgieter, An
;
Vexler, Mikhail
;
Vandemaele, Michiel
;
Wang, Runsheng
;
Spessot, Alessio
;
Vaisman Chasin, Adrian
;
Kaczer, Ben
DOI
10.3390/mi14112018
ISSN
2072-666X
PMID
MEDLINE:38004876
Issue
11
Journal
MICROMACHINES
Volume
14
Title
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
Publication type
Journal article
Embargo date
2023-10-30
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Summary
2
20.500.12860/43334.2
*
2024-02-05T16:04:54Z
validation by library/open access desk
1
20.500.12860/43334
2023-12-31T17:21:40Z
*Selected version
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