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dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorBury, Erik
dc.contributor.authorGrill, Alexander
dc.contributor.authorYu, Zhuoqing
dc.contributor.authorMakarov, Alexander
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorVexler, Mikhail
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorWang, Runsheng
dc.contributor.authorSpessot, Alessio
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorKaczer, Ben
dc.date.accessioned2024-02-05T16:07:47Z
dc.date.available2023-12-31T17:21:40Z
dc.date.available2024-02-05T16:07:47Z
dc.date.issued2023
dc.identifier.issn2072-666X
dc.identifier.otherWOS:001119977200001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43334.2
dc.sourceWOS
dc.titleCompact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
dc.typeJournal article
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorMakarov, Alexander
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecMakarov, Alexander::0000-0002-9927-6511
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecSpessot, Alessio::0000-0003-2381-0121
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo2023-10-30
dc.identifier.doi10.3390/mi14112018
dc.source.numberofpages18
dc.source.peerreviewyes
dc.source.beginpageArt. 2018
dc.source.endpageN/A
dc.source.journalMICROMACHINES
dc.identifier.pmidMEDLINE:38004876
dc.source.issue11
dc.source.volume14
imec.availabilityPublished - open access
dc.description.wosFundingTextNo Statement Available


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