dc.contributor.author | Tyaginov, Stanislav | |
dc.contributor.author | Bury, Erik | |
dc.contributor.author | Grill, Alexander | |
dc.contributor.author | Yu, Zhuoqing | |
dc.contributor.author | Makarov, Alexander | |
dc.contributor.author | De Keersgieter, An | |
dc.contributor.author | Vexler, Mikhail | |
dc.contributor.author | Vandemaele, Michiel | |
dc.contributor.author | Wang, Runsheng | |
dc.contributor.author | Spessot, Alessio | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Kaczer, Ben | |
dc.date.accessioned | 2024-02-05T16:07:47Z | |
dc.date.available | 2023-12-31T17:21:40Z | |
dc.date.available | 2024-02-05T16:07:47Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2072-666X | |
dc.identifier.other | WOS:001119977200001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43334.2 | |
dc.source | WOS | |
dc.title | Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range | |
dc.type | Journal article | |
dc.contributor.imecauthor | Tyaginov, Stanislav | |
dc.contributor.imecauthor | Bury, Erik | |
dc.contributor.imecauthor | Grill, Alexander | |
dc.contributor.imecauthor | Makarov, Alexander | |
dc.contributor.imecauthor | De Keersgieter, An | |
dc.contributor.imecauthor | Vandemaele, Michiel | |
dc.contributor.imecauthor | Spessot, Alessio | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Tyaginov, Stanislav::0000-0002-5348-2096 | |
dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
dc.contributor.orcidimec | Makarov, Alexander::0000-0002-9927-6511 | |
dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
dc.contributor.orcidimec | Spessot, Alessio::0000-0003-2381-0121 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.date.embargo | 2023-10-30 | |
dc.identifier.doi | 10.3390/mi14112018 | |
dc.source.numberofpages | 18 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 2018 | |
dc.source.endpage | N/A | |
dc.source.journal | MICROMACHINES | |
dc.identifier.pmid | MEDLINE:38004876 | |
dc.source.issue | 11 | |
dc.source.volume | 14 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | No Statement Available | |