Browsing by author "Makarov, Alexander"
Now showing items 1-8 of 8
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Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Zhuoqing; Makarov, Alexander; De Keersgieter, An; Vexler, Mikhail; Vandemaele, Michiel; Wang, Runsheng; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023) -
High-Density Standard Cell Libraries with Backside Power Options in A14 Nanosheet Node
Kükner, Halil; Mirabelli, Gioele; Yang, Sheng; Zhou, Yun; Makarov, Alexander; Xiang, Yang; Boemmels, Juergen; Veloso, Anabela; Zografos, Odysseas; Weckx, Pieter; Ryckaert, Julien; Hellings, Geert (2024) -
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations
Vandemaele, Michiel; Kaczer, Ben; Bury, Erik; Franco, Jacopo; Vaisman Chasin, Adrian; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido (2023-05-15) -
On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors
Tyaginov, Stanislav; Afzalian, Aryan; Makarov, Alexander; Grill, Alexander; Vandemaele, Michiel; Cherenev, Maksim; Vexler, Mikhail; Hellings, Geert; Kaczer, Ben (2022) -
On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Z.; Makarov, Alexander; De Keersgieter, An; Vexler, M. I.; Vandemaele, Michiel; Wang, R.; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023) -
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Bury, Erik; Vaisman Chasin, Adrian; Franco, Jacopo; Makarov, Alexander; Mertens, Hans; Hellings, Geert; Groeseneken, Guido (2022-05-02) -
Structure, electronic properties, and energetics of oxygen vacancies in varying concentrations of SixGe1-xO2
El-Sayed, Al-Moatasem; Jech, Markus; Waldhoer, Dominic; Makarov, Alexander; Vexler, Mikhail, I; Tyaginov, Stanislav (2022) -
Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD Study
Vandemaele, Michiel; Kaczer, Ben; Tyaginov, Stanislav; Franco, Jacopo; Bury, Erik; Vaisman Chasin, Adrian; Makarov, Alexander; Hellings, Geert; Groeseneken, Guido (2023)