EISBN
978-1-6654-5672-2
ISSN
1541-7026
Conference
61st IEEE International Reliability Physics Symposium (IRPS)
Journal
2023 IEEE International Reliability Physics Symposium (IRPS)
Research discipline
Electrical & electronic engineering
Title
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations
Publication type
Proceedings paper
Embargo date
2023-05-15