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Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress
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Authors
Lee, Kookjin
;
Kaczer, Ben
;
Kruv, Anastasiia
;
Gonzalez, Mario
;
Degraeve, Robin
;
Tyaginov, Stanislav
;
Grill, Alexander
;
De Wolf, Ingrid
DOI
10.1109/LED.2021.3104885
ISSN
0741-3106
Issue
10
Journal
IEEE ELECTRON DEVICE LETTERS
Volume
42
Title
Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress
Publication type
Journal article
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Date
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4
20.500.12860/37530.4
*
2022-07-01T08:42:16Z
validation by library/open access desk
3
20.500.12860/37530.3
2022-06-24T11:40:51Z
validation by imec author
2
20.500.12860/37530.2
2022-06-24T10:22:34Z
validation by imec author
1
20.500.12860/37530
2021-11-02T15:56:37Z
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