Browsing by author "De Wolf, Ingrid"
Now showing items 1-20 of 558
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1/f noise measurements for faster electromigration characterization
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2016) -
1/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnections
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2016) -
11-Megapixel CMOS-integrated SiGe micromirror arrays for high-end applications
Witvrouw, Ann; Haspeslagh, Luc; Varela Pedreira, Olalla; De Coster, Jeroen; De Wolf, Ingrid; Tilmans, Harrie; Bearda, Twan; Schlatmann, Bart; van Bommel, Mark; de Nooijer, Christine; Magnee, P.H.C.; Lous, E.J.; Hagting, Marco; Lauria, John; Vanneer, Roel; van Drieenhuizen, Bert (2010) -
3-D technology: failure analysis challenges
De Wolf, Ingrid (2016) -
3D chip package interaction thermo-mechanical challenges: proximity effects of through silicon vias and μ-bumps
Guo, Wei; Van der Plas, Geert; Ivankovic, Andrej; Eneman, Geert; Cherman, Vladimir; De Wachter, Bart; Mercha, Abdelkarim; Gonzalez, Mario; Civale, Yann; Redolfi, Augusto; Buisson, Thibault; Jourdain, Anne; Vandevelde, Bart; Rebibis, Kenneth June; De Wolf, Ingrid; La Manna, Antonio; Beyer, Gerald; Beyne, Eric; Swinnen, Bart (2012) -
3D Device/package fault isolation and failure analysis
De Wolf, Ingrid (2017) -
3D IC analysis using magnetic field imaging
Gaudestad, Jan; Orozco, A.; De Wolf, Ingrid; Jeffers, A.; Cheng, B.; Wellstood, F.C. (2013) -
3D Integration: Circuit design, test and reliability challenges
Minas, Nikolaos; De Wolf, Ingrid; Marinissen, Erik Jan; Stucchi, Michele; Oprins, Herman; Mercha, Abdelkarim; Van der Plas, Geert; Velenis, Dimitrios; Marchal, Pol (2010) -
3D Localization of liner breakdown within Cu filled TSV?s by backside LIT and PEM defocusing series
Altmann, Frank; Grosse, Christian; De Wolf, Ingrid; Brand, Sebastian (2017) -
3D MEMS Metrology @ IMEC: opportunities and problems
Pieters, Philip; De Wolf, Ingrid (2008) -
3D printed liquid jet impingement cooler: Demonstration, opportunities and challenges
Wei, Tiwei; Oprins, Herman; Cherman, Vladimir; De Wolf, Ingrid; Beyne, Eric; Yang, Shoufeng; Baelmans, Martine (2018) -
3D stacking induced mechanical stress effects
Cherman, Vladimir; Van der Plas, Geert; De Vos, Joeri; Ivankovic, Andrej; Lofrano, Melina; Simons, Veerle; Gonzalez, Mario; Vanstreels, Kris; Wang, Teng; Daily, Robert; Guo, Wei; Beyer, Gerald; La Manna, Antonio; De Wolf, Ingrid; Beyne, Eric (2014) -
3D-convolution based fast transient thermal model for 3D integrated circuits: methodology and applications
Maggioni, Federica; Oprins, Herman; Milojevic, Dragomir; Beyne, Eric; De Wolf, Ingrid; Baelmans, Martine (2015) -
50Gb/s C-band GeSi waveguide electro-absorption modulator
Srinivasan, Ashwyn; Verheyen, Peter; Loo, Roger; De Wolf, Ingrid; Pantouvaki, Marianna; Lepage, Guy; Balakrishnan, Sadhishkumar; Vanherle, Wendy; Absil, Philippe; Van Campenhout, Joris (2016) -
A combined modelling approach to design test structures to study thermomigration in Cu interconnects
Ding, Youqi; Lofrano, Melina; Varela Pedreira, Olalla; Zahedmanesh, Houman; Croes, Kristof; De Wolf, Ingrid (2022) -
A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
van Spengen, Merlijn; Puers, Bob; Mertens, Robert; De Wolf, Ingrid (2004) -
A Critical Analysis of the Thermo-Optic Time Constant in Si Photonic Devices
Coenen, David; Kim, Minkyu; Oprins, Herman; Van Campenhout, Joris; De Wolf, Ingrid (2024) -
A dedicated loading instrument for characterization and testing of MEMS
Kalicinski, Stanislaw; Sabuncuoglu Tezcan, Deniz; De Moor, Piet; De Vries, Atze-Cees; Van Hoof, Chris; Wevers, Martine; De Wolf, Ingrid (2005-10) -
A framework for combined simulations of electromigration induced stress evolution, void nucleation, and its dynamics: Application to nano-interconnect reliability
Saleh, Ahmed; Croes, Kristof; Ceric, H.; De Wolf, Ingrid; Zahedmanesh, Houman (2023) -
A low frequency electrical test set-up for the reliability assessment of capacitive RF MEMS switches
De Wolf, Ingrid; van Spengen, Merlijn; Mertens, Robert; Puers, Robert (2003-05)