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Articles
A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
Publication:
A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
van Spengen, Merlijn
;
Puers, Bob
;
Mertens, Robert
;
De Wolf, Ingrid
Journal
Journal of Micromechanics and Microengineering
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2057
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations
Metrics
Views
2057
since deposited on 2021-10-15
Acq. date: 2025-12-10
Citations