3D Integration: Circuit design, test and reliability challenges

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Authors
Minas, Nikolaos; De Wolf, Ingrid; Marinissen, Erik Jan; Stucchi, Michele; Oprins, Herman; Mercha, Abdelkarim; Van der Plas, Geert; Velenis, Dimitrios; Marchal, Pol
Conference
16th IEEE International On-Line Testing Symposium - IOLTS
Title
3D Integration: Circuit design, test and reliability challenges
Publication type
Proceedings paper
Embargo date
9999-12-31
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