Publication:

3D Integration: Circuit design, test and reliability challenges

Date

2010

Proceedings Paper

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Files

20929.pdf 61.82 KB

Author(s)

Minas, Nikolaos

;

De Wolf, Ingrid

;

Marinissen, Erik Jan

;

Stucchi, Michele

;

;

Mercha, Abdelkarim

;

Van der Plas, Geert

;

Velenis, Dimitrios

;

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