Impact of the device geometric parameters on hot-carrier degradation in FinFETs

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Authors

Tyaginov, Stanislav; Makarov, Alexander; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor

ISSN

1063-7826

Issue

13

Journal

Semiconductors

Volume

52

Title

Impact of the device geometric parameters on hot-carrier degradation in FinFETs

Publication type

Journal article

Embargo date

9999-12-31

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