Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Impact of the device geometric parameters on hot-carrier degradation in FinFETs
Publication:
Impact of the device geometric parameters on hot-carrier degradation in FinFETs
Copy permalink
Date
2018
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
40692.pdf
545.42 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tyaginov, Stanislav
;
Makarov, Alexander
;
Kaczer, Ben
;
Jech, Markus
;
Vaisman Chasin, Adrian
;
Grill, Alexander
;
Hellings, Geert
;
Vexler, Mikhail
;
Linten, Dimitri
;
Grasser, Tibor
Journal
Semiconductors
Abstract
Description
Statistics
Views
1897
since deposited on 2021-10-26
1
last month
1
last week
Acq. date: 2026-01-25
Citations
Statistics
Views
1897
since deposited on 2021-10-26
1
last month
1
last week
Acq. date: 2026-01-25
Citations