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Impact of the device geometric parameters on hot-carrier degradation in FinFETs
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Impact of the device geometric parameters on hot-carrier degradation in FinFETs
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Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tyaginov, Stanislav
;
Makarov, Alexander
;
Kaczer, Ben
;
Jech, Markus
;
Vaisman Chasin, Adrian
;
Grill, Alexander
;
Hellings, Geert
;
Vexler, Mikhail
;
Linten, Dimitri
;
Grasser, Tibor
Journal
Semiconductors
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1895
since deposited on 2021-10-26
Acq. date: 2025-12-11
Citations
Metrics
Views
1895
since deposited on 2021-10-26
Acq. date: 2025-12-11
Citations