Browsing by author "Michl, J."
Now showing items 1-5 of 5
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A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
Grill, Alexander; Michl, J.; Diaz Fortuny, Javier; Beckers, Arnout; Bury, Erik; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; De Greve, Kristiaan (2023) -
Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS
Michl, J.; Grill, Alexander; Stampfer, B.; Waldhoer, D.; Schleich, C.; Knobloch, T.; Ioannidis, E.; Enichlmair, H.; Minixhofer, R.; Kaczer, Ben; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Grasser, T.; Waltl, M. (2021) -
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Michl, J.; Grill, A.; Claes, D.; Rzepa, G.; Kaczer, B.; Linten, D.; Radu, I; Grasser, T.; Waltl, M. (2020) -
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
Michl, J.; Grasser, T.; Waltl, M.; Grill, Alexander; Bury, Erik; Tyaginov, Stanislav; Linten, Dimitri; Parvais, Bertrand; Kaczer, Ben; Radu, Iuliana (2020) -
Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors
Grill, Alexander; John, Valentin; Michl, J.; Beckers, Arnout; Bury, Erik; Tyaginov, Stanislav; Parvais, Bertrand; Vaisman Chasin, Adrian; Grasser, T.; Waltl, M.; Kaczer, Ben; Govoreanu, Bogdan (2022)