Publication:

A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays

Date

2023

Proceedings Paper

https://doi.org/10.1109/EDTM55494.2023.10102937

Simple item page Full metadata Statistics

Author(s)

Grill, Alexander

;

;

Diaz Fortuny, Javier

;

Beckers, Arnout

;

;

Vaisman Chasin, Adrian

;

;

;

;

De Greve, Kristiaan

Journal

7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)

Statistics

1024 since deposited on 2023-09-03

Acq. date: 2026-06-11