Publication:
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | Michl, J. | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Beckers, Arnout | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Grasser, T. | |
| dc.contributor.author | Waltl, M. | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | De Greve, Kristiaan | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | Diaz Fortuny, Javier | |
| dc.contributor.imecauthor | Beckers, Arnout | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | De Greve, Kristiaan | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
| dc.contributor.orcidimec | Beckers, Arnout::0000-0003-3663-0824 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | De Greve, Kristiaan::0000-0002-1314-9715 | |
| dc.date.accessioned | 2023-11-28T09:10:57Z | |
| dc.date.available | 2023-09-03T17:38:49Z | |
| dc.date.available | 2023-11-28T09:10:57Z | |
| dc.date.issued | 2023 | |
| dc.description.wosFundingText | This work is funded in part by imec's Industrial Affiliation Program on Quantum Computing and Cryoelectronics. Furthermore, the financial support by the Austrian Federal Ministry for Digital and Economic Affairs, the National Foundation for Research, Technology and Development and the Christian Doppler Research Association is gratefully acknowledged. | |
| dc.identifier.doi | 10.1109/JCS57290.2023.10102937 | |
| dc.identifier.eisbn | 979-8-3503-3252-0 | |
| dc.identifier.issn | na | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42455 | |
| dc.publisher | IEEE | |
| dc.source.conference | 7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM) | |
| dc.source.conferencedate | MAR 07-10, 2023 | |
| dc.source.conferencelocation | Seoul | |
| dc.source.journal | na | |
| dc.source.numberofpages | 3 | |
| dc.title | A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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